The 20th Guangzhou (China) International Surface Finishing, Electroplating and Coating Exhibition (SF EXPO)-The 20th Guangzhou (China) International Surface Finishing, Electroplating and Coating Exhibition - SFEXPO
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2026-10-31

Semiconductor Electroplating: The Underrated "Old Craft" Powering the AI Chip Battle

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The actual signal-transmitting components inside a chip are layers of "wires" made of copper. These copper layers are not cast or evaporated onto the surface; they are "grown" from a chemical bath under an electric current—this process is called electroplating.

Over the past two years, AI computing power has pushed advanced packaging into the spotlight: CoWoS capacity is being snapped up, HBM is in short supply, and Chiplet and 3D stacking have become buzzwords. Breaking down these concepts, the one common denominator is clear: no matter how packaging forms evolve, the method for creating vertical connections between chips is mostly electroplating. The 12-layer DRAM stacking in HBM3E relies on TSVs filled with electroplated copper; the micro-bumps between GPUs and interposers rely on electroplated copper pillars; RDL rewiring relies on electroplating to thicken copper traces; and even the internal wires connecting transistors within a chip are built up by copper electroplating.

On one hand, "star processes" like photolithography and etching dominate the headlines. On the other hand, this old craft—whose principles can be traced back to middle school textbooks—has become the deciding factor in advanced packaging.

01 The Essence of Electroplating: It's Just That Middle School Chemistry Problem

The principle of electroplating is not profound: the workpiece acts as the cathode and is immersed in a chemical bath containing metal ions. When direct current is applied, the metal ions gain electrons at the surface, reduce, and deposit into a metal layer. The core reaction for copper plating is just one line:

Cu²⁺ + 2e⁻ → Cu

What makes semiconductor electroplating different is precision—it requires copper to seamlessly fill nano-to-micro-scale trenches and deep via holes without leaving any voids. Compared to vacuum thin-film deposition methods like PVD and CVD, it is more pragmatic:

Comparison Item Electroplating (ECP) PVD / CVD Thin-Film Deposition
Process Temperature 20–60°C (Copper sulfate system) PVD can be close to room temperature; CVD often requires heating to several hundred °C.
Vacuum No vacuum required Requires a vacuum chamber
Thick Copper Fast speed, low cost Slow and expensive for thick films
Prerequisites A conductive layer must already exist on the surface Can be deposited directly

The trade-off lies precisely in that "prerequisite": the wafer surface must first have a conductive path. Therefore, a barrier layer and a copper seed layer must always be deposited before electroplating—an upstream step that is inherently a PVD task.

02 Five Frontline Applications: From Inside the Chip to Advanced Packaging

① Copper Interconnects (Damascene). The mainstream approach for back-end-of-line (BEOL) routing involves: Etching trenches and vias → Depositing barrier and seed layers → Electroplating to fill copper → Using CMP to polish away excess copper. With line widths ranging from ~20 nm to several hundred nanometers, optimized chemistries and current waveforms allow filling in seconds—but a single void can scrap an entire chip.

② TSVs (Through-Silicon Vias). Holes tens to hundreds of microns deep are drilled into silicon and then filled with copper. Using PVD or CVD for such deep vias is unacceptable in both efficiency and cost, making electroplating the de facto standard. The challenge: In vias this deep, how do you ensure bottom-up copper growth rather than having the via opening "pinch off" prematurely?

③ RDLs (Redistribution Layers). Advanced packaging relies on RDLs to fan out chip pads: Patterning photoresist → Seed layer → Electroplating to thicken copper traces. Used extensively in Fan-Out, Wafer-Level Packaging (WLP), and Chiplets, line widths are shrinking from 2 μm to 0.5 μm—with every scaling step, the demand for plating uniformity rises to a new level.

④ Copper Pillars and Micro-bumps. Flip-chip electrical connections rely on bumps. Transitioning from C4 solder bumps to Copper Pillar Bumps (CPB) is a plating upgrade: Copper's resistivity is ~1.72 μΩ·cm, roughly one-tenth that of SnAg solder; its thermal conductivity is ~400 W/(m·K), nearly ten times higher. Bump diameters shrink from C4's ~50–200 μm down to 15–30 μm for copper pillars (commonly 20–30 μm), with pitch compressed from 150–200 μm to the 40 μm range, and fine pitches at 20–30 μm.
Electromigration Resistance: Under accelerated testing at 177°C and 0.8A (with another group at 0.6A/140°C), copper pillar lifespan is nearly two orders of magnitude longer than same-pitch SnAg bumps (preliminary results; do not compare across different test parameters).

⑤ MEMS Thick Metals. Micro-coils, magnetic structures, and micro-actuators require metals tens to hundreds of microns thick. Thin-film deposition is unacceptably slow, so the industry standard is to use thick-resist lithography to create molds, followed by electroplating copper, nickel, or NiFe.

03 The Real Black Magic: Making Copper Grow "Bottom-Up"

The hardest part of via filling isn't the plating itself, but controlling where the copper grows. If deposition at the via opening is faster than at the bottom, it forms a "mushroom" shape (donut, dog-bone) and prematurely seals the top, leaving a void inside—this is called a pinch-off void. The industry solution is Bottom-Up filling, relying on the synergy of three types of organic additives:

  • Accelerator: Reaches the via bottom first to increase the deposition rate;

  • Suppressor: Adsorbs on sidewalls and surfaces, applying the "brakes";

  • Leveler: Increases polarization in high-current-density areas (usually at the top) to prevent overplating.

The ratio of these three additives corresponds to completely different application scenarios:

Category Dual Damascene TSV Copper Pillar
Feature Size 20nm × 170nm 10μm × 100μm ~20μm pillar diameter × height
Fill Time Seconds (as short as <1s) ~40 mins ~7.5 mins
Accelerator High concentration Medium / Low Medium / Low
Leveler Strategy Suppress trench top Polarize via sidewalls Polarize inside mold cavity

(Values in the table are representative for specific formulations and process conditions; for reference only.)

Though it's all copper filling, a size difference of roughly 5,000 times means the formulation must be rebuilt from scratch. Plating chemistries are therefore "formulation-based" materials—the barrier isn't the molecular formula, but the process know-how.

All of this is governed by polarization: Appropriately increased polarization leads to rapid nucleation and fine-grained deposits. Excessive polarization or overly high current density causes deposition to run out of control, resulting in burning and nodule formation. Localized hydrogen evolution can also cause pinholes and blistering. The current efficiency of acid copper sulfate plating is typically over 95%; hydrogen ions are difficult to discharge in this system, and hydrogen evolution is inherently weak—hydrogen embrittlement is a pitfall for zinc plating and high-strength steel, not copper plating. What wafer electroplating truly needs to avoid is the runaway zone at high current densities.

The engineering window that must be maintained includes current density, temperature, agitation flow field, and the concentrations of Cu²⁺, sulfuric acid, chloride ions, and the three additives in the bath—a window so narrow that it must be safeguarded through real-time monitoring and statistical process control (SPC).

04 Why Now?

The global advanced packaging market is projected to grow from $37.8 billion in 2023 to $69.5 billion in 2029, representing a CAGR of approximately 10.7% (per Yole, an increase of $31.7 billion over six years). Among these, 2.5D/3D packaging is growing the fastest (IDC estimates a CAGR of ~22%), while HBM growth significantly outpaces the industry average (estimates vary; specific figures omitted).

The four major "building blocks" supporting these architectures are bumps, RDLs, TSVs, and hybrid bonding—and the first three all rely on electroplating. Every time bump size, line width, and aspect ratio scale down, it exerts extreme pressure on electroplating uniformity, fill capability, and throughput.

As Moore's Law slows down, "Packaging Moore's Law" takes the baton: interconnect pitch is being compressed from the early 1,000-micron level down to the 5-micron level (hybrid bonding). The performance race has extended from "making transistors smaller" to "making interconnects denser"—and electroplating sits right at the center of this extension line.

05 Closing Thoughts

The industry loves to talk about lithography machines and process nodes: one symbolizes being "choked at the throat" (bottlenecked), and the other is simple and straightforward. But chip manufacturing is a long chain: without CMP planarization, lithography cannot focus accurately; without seamless electroplating fill, even the most advanced transistors cannot connect out.

Electroplating isn't glamorous, but it's essential enough—an AI chip might not have its own lithography machine, but it absolutely cannot do without a stable electroplating production line. Next time someone talks to you about advanced packaging, you might want to ask: "How exactly does the copper get filled in?"

Originally published by the "Life in a Grocery Store" WeChat Official Account. If there is any infringement, please contact us for deletion.

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